Mathematical Model for Predicting the Resistivity of an Electroconductive Woven Structure

Abstract

Highly conductive woven fabrics (WF) can be used as electronic components. Resistivity is an intrinsic physical property of the conductive textile materials (CTM). The McLachlan model that describes the resistivity of a two-component macroscopic composite (TCMC) subjected to a constant external electric field was proposed to predict the resistivity of fabrics. The volume fraction of voids in material, the voids dimension, and a single morphology parameter were taken into account. The resistivity of a chosen WF was determined based on the model. Verification of the received results was carried out. In the case of four samples, the verification was confirmed by the high level of prediction being in the range of 83–88%. In the case of one sample, the verification was negative (26%). This allowed one to pay attention to the influence of compactness and irregularity of the woven structure on results received using the model.