CITATION STYLE
Garcia, R., Tamayo, J., Gonzalez, L., & Gonzalez, Y. (1997). Compositional Characterization of III-V Semiconductor Heterostructures by Friction Force Microscopy. In Micro/Nanotribology and Its Applications (pp. 275–282). Springer Netherlands. https://doi.org/10.1007/978-94-011-5646-2_19
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