AFM, Tapping Mode

Abstract

The tapping or AM-mode is the most common dynamic mode used in atomic force microscopy. In dynamic mode AFM the cantilever is oscillated with (or near) its resonance frequency near the sample surface. Using a feedback electronic the cantilever sample distance is controlled by keeping either the amplitude or the phase of the oscillating cantilever constant. Since lateral tip--sample forces are avoided by this technique the resolution is typically higher compared to the classical contact mode AFM where tip and sample are in direct mechanical contact.