The HRXRD and FTIR characterization of HgCdTe epilayers grown by vertical Dipping Liquid Phase Epitaxy was analyzed to indicate the presence of < 2 μm low-x HgCdTe over layer. A higher angle shoulder in HRXRD rocking curve and a graded cut-on as well as a double fringe pattern in FTIR was observed. Removal of ~2μm surface layer by chemical etching improved the FTIR and HRXRD curves.
CITATION STYLE
Nokhwal, R., Pandey, A., Sharma, B. L., Sharma, P., Garg, P., Hashmi, S. A., & Sharma, R. K. (2014). Observation of Over-Layer deposition on HgCdTe Epilayers grown by Vertical dipping Liquid Phase Epitaxy. In Environmental Science and Engineering (pp. 829–831). Springer Science and Business Media Deutschland GmbH. https://doi.org/10.1007/978-3-319-03002-9_214
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