Inelastic X-ray scattering from phonons

Abstract

This Chapter presents the current status of phonon-dispersion studies using very high energy resolution inelastic X-ray scattering. The theoretical background and the instrumental principles are briefly summarized. This is followed by a representative selection of studies on single crystals and polycrystalline materials, including high-pressure work. The Chapter concludes with novel applications of the technique. © Springer-Verlag Berlin/Heidelberg 2006.