Direct observation of the metamorphism of silicon oxide grains

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Abstract

Experimental studies on the metamorphism of SiOx grains under heating at 10-6 Pa have been conducted using a high-resolution transmission electron microscope. Si crystallites were predominantly grown at 500 to 700°C in SiOx grains. The Si crystallites disappeared at 800°C and evaporated as the SiO phase.

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Kamitsuji, K., Ueno, S., Suzuki, H., Kimura, Y., Sato, T., Tanigaki, T., … Kaito, C. (2004). Direct observation of the metamorphism of silicon oxide grains. Astronomy and Astrophysics, 422(3), 975–979. https://doi.org/10.1051/0004-6361:20034353

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