The mechanism of diffusional transport during low-energy ion nitriding of aluminum has been investigated using marker and isotope sequence techniques in connection with ion-beam analysis. For an ion energy of 1 keV and a temperature of 400°C, it is shown that the nitride grows at the surface with aluminum being supplied by diffusion from the underlying bulk. © 2000 American Institute of Physics.
CITATION STYLE
Telbizova, T., Parascandola, S., Kreissig, U., Günzel, R., & Möller, W. (2000). Mechanism of diffusional transport during ion nitriding of aluminum. Applied Physics Letters, 76(11), 1404–1406. https://doi.org/10.1063/1.126070
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