Surface modification of sputtered NiOx hole transport layer for CH3NH3PbI3 perovskite solar cells

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Abstract

The modification of the sputtered NiOx (x ≧ 1)/CH3NH3PbI3 interface by 2-(3,6-dimethoxy-9H-carbazol-9-yl) ethyl] phosphonic acid (MeO-2PACz) considerably enhances the power conversion efficiency of perovskite solar cells whose structure is ITO/NiOx/CH3NH3PbI3/[6,6]-phenyl C61 butyric acid methyl ester (PCBM)/aluminum-doped zinc oxide (AZO)/Ag. In devices without MeO-2PACz, the internal quantum efficiency (IQE) above 450 nm increases with the increase in NiOx thickness from 4 to 53 nm, although even in the thickest case, the IQE never reaches 90%. On the other hand, devices with MeO-2PACz modified NiOx show thickness-insensitive IQE of ca. 90%. We propose that (1) MeO-2PACz effectively fills the pinholes in thinner NiOx and (2) it passivates the carrier trapping/recombination defects at the NiOx/perovskite interface.

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APA

Yanagida, M., Nakamura, T., Yoshida, T., Khadka, D. B., Shirai, Y., & Miyano, K. (2023). Surface modification of sputtered NiOx hole transport layer for CH3NH3PbI3 perovskite solar cells. Japanese Journal of Applied Physics, 62(SK). https://doi.org/10.35848/1347-4065/acd5dc

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