Two-junction superconductor-normal metal single-electron trap in a combined on-chip RC environment

Abstract

Dissipative properties of the electromagnetic environment as well as on-chip RC filtering are shown to suppress random state switchings in the two-junction superconductor(S) - normal metal(N) electron trap. In our experiments, a local high-ohmic resistor increased the hold time of the trap by up to two orders of magnitude. A strong effect of on-chip noise filtering was observed for different on-chip geometries. The obtained results are promising for realization of the current standard on the basis of the S-N hybrid turnstile. © Published under licence by IOP Publishing Ltd.