CITATION STYLE
Vandenrijt, J. F., Thizy, C., Alexeenko, I., Jorge, I., López, I., De Ocáriz, I. S., … Georges, M. (2009). Electronic speckle pattern Interferometry at long infrared wavelengths. Scattering requirements. In Fringe 2009 - 6th International Workshop on Advanced Optical Metrology (pp. 596–599). Springer Science and Business Media Deutschland GmbH. https://doi.org/10.1007/978-3-642-03051-2_102
Mendeley helps you to discover research relevant for your work.