Data handling techniques in online semiconductor technology CAD laboratory

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Abstract

Modern semiconductor manufacturing is recognized as a specialized field in electrical engineering curricula. Teaching micro- and nanoelectronics in university environment is a challenging task and a new framework is needed. An integrated measurement-based microelectronics laboratory along with technology computer aided design (TCAD) simulation laboratory has been developed and is in use for imparting hands-on laboratory experience to the students. An internet-based laboratory management system for monitoring and control of a real-time measurement system interfaced via a dedicated local computer is discussed. TCAD process/device simulations generate a vast amount of data and handling of the data is a challenge for web-based applications. A simple architecture for implementation, visualization and analyses of the generated data from process/ device simulations is reported.

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APA

Maiti, A., & Tripathy, B. K. (2011). Data handling techniques in online semiconductor technology CAD laboratory. International Journal of Online Engineering, 7(Specialissue2), 26–32. https://doi.org/10.3991/ijoe.v7iS2.1753

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