Subnanometer displacement detection lays the solid foundation for critical applications in modern metrology. In-plane displacement sensing, however, is mainly dominated by the detection of differential photocurrent signals from photodiodes, with resolution in the nanometer range. Here, we present an integrated nanoelectromechanical in-plane displacement sensor based on a nanoelectromechanical trampoline resonator. With a position resolution of 4 pm/Hz for a low laser power of 85 μW and a repeatability of 2 nm after five cycles of operation as well as good long-term stability, this new detection principle provides a reliable alternative for overcoming the current position detection limit in a wide variety of research and application fields.
CITATION STYLE
Chien, M. H., Steurer, J., Sadeghi, P., Cazier, N., & Schmid, S. (2020). Nanoelectromechanical Position-Sensitive Detector with Picometer Resolution. ACS Photonics, 7(8), 2197–2203. https://doi.org/10.1021/acsphotonics.0c00701
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