A high-sensitive digital photosensor using MOS interface-trap charge pumping

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Abstract

A high-sensitive CMOS photosensor based on a pulse frequency modulation (PFM) scheme is presented. We propose and demonstrate the high-sensitive PFM photosensor, whose output frequency is proportionate to the incident light intensity, that utilizes MOS interface-trap charge pumping (ITCP) as a frequency-controlled ultralow current. The proposed pixel sensorconsists of only 4 transistors: a transistor as an ultralow current source; a sense amplifier transistor; a selection transistor; and, a reset transistor. The prototype device is fabricated using 0.6-µm standard CMOS technology. High sensitivity 4.0 × 105Hz/(W · m-2), which is larger than two orders of magnitude compared to previous works, wasobtained. © 2004, The Institute of Electronics, Information and Communication Engineers. All rights reserved.

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Uehara, A., Kagawa, K., Tokuda, T., Ohta, J., & Nunoshita, M. (2004). A high-sensitive digital photosensor using MOS interface-trap charge pumping. IEICE Electronics Express, 1(18), 556–561. https://doi.org/10.1587/elex.1.556

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