Scanning electron microscopy (SEM) methods for dental enamel

Abstract

Scanning electron microscopy (SEM) is exceptionally well suited for the study of the structure of dental enamel, due to its ability to create high-resolution images of hard surfaces. Continuous attention on how to arrive at the observation stage with a clean and dry specimen is one main aspect of specimen preparation. Other main aspects are choice of whether the specimen should be embedded or not, choice of plane of section, and choice of acid-etching regime. Special attention is given to the preparation of small specimens and how to prepare and observe more than one plane or aspect in the same specimen.