This paper describes the physical properties and sensing characteristics of Yb 2 O 3 sensing membranes grown on Si(100) substrates by reactive sputtering. The structural and morphological features of these films with annealing at various temperatures were studied by X-ray diffraction, X-ray photoelectron spectroscopy, and atomic force microscopy. We found that Yb 2 O 3 films annealed at 800°C exhibit a high sensitivity of 55.5 mVpH, a low hysteresis voltage of 3.76 mV, and a small drift rate of 1.54 mVh. The good performance resulting from this annealing condition can be ascribed to the well-crystallized Yb 2 O 3 structure, the thin silica layer, and the large surface roughness. © 2009 The Electrochemical Society.
CITATION STYLE
Pan, T.-M., Cheng, C.-H., & Lee, C.-D. (2009). Yb[sub 2]O[sub 3] Thin Films as a Sensing Membrane for pH-ISFET Application. Journal of The Electrochemical Society, 156(5), J108. https://doi.org/10.1149/1.3089365
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