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Journal Article

Technical aspects of scanning probe microscopy

NanoScience and Technology (2015) 69 31-63
DOI: 10.1007/978-3-662-45240-0_3
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Voigtländer, B. (2015). Technical aspects of scanning probe microscopy. NanoScience and Technology, 69, 31–63. https://doi.org/10.1007/978-3-662-45240-0_3

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