3—D Characterisation of the Electrostatic Potential in an Electrically Biased Silicon Device

Twitchett-Harrison, A. C., Dunin-Borkowski, R. E., & Midgley, P. A. (2008). 3—D Characterisation of the Electrostatic Potential in an Electrically Biased Silicon Device. In Microscopy of Semiconducting Materials 2007 (pp. 379–382). Springer Netherlands. https://doi.org/10.1007/978-1-4020-8615-1_81