Thin films of the colossal magnetoresistance material La 1-xSrxMnO3 (LSMO) grown on SrTiO3 substrates exhibit bi-axial magnetocrystalline anisotropy with easy axes along the [110] and [11̄0] directions. We have recently discovered that the intrinsic biaxial magnetic anisotropy combined with a giant planar Hall effect lead to striking switching behavior in the transverse resistivity of LSMO films (Appl. Phys. Lett. 84, 2593 (2004)). Here we use this phenomenon as a sensitive tool for measuring in-plane magnetization in order to characterize the magnetic anisotropy. © 2004 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
CITATION STYLE
Bason, Y., Klein, L., Yau, J. B., Hong, X., & Ahn, C. H. (2004). Characterization of the magnetic anisotropy in thin films of La 1-xSrxMnO3 using the planar Hall effect. In Physica Status Solidi C: Conferences (Vol. 1, pp. 3336–3338). https://doi.org/10.1002/pssc.200405450
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