Skip to main content
Book Chapter

Relativistic Effects to Diffraction and Imaging by a Transmission Electron Microscope

  • Tanaka N
Springer Japan, (2017), 309-312
DOI: 10.1007/978-4-431-56502-4_31
N/ACitations
Citations of this article
3Readers
Mendeley users who have this article in their library.
Get full text

Cite

CITATION STYLE

APA

Tanaka, N. (2017). Relativistic Effects to Diffraction and Imaging by a Transmission Electron Microscope. In Electron Nano-Imaging (pp. 309–312). Springer Japan. https://doi.org/10.1007/978-4-431-56502-4_31

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free