Real-time in-situ X-ray beam diagnostics

Abstract

We report on a novel diagnostics instrument for in-situ imaging and measurements of X-ray beam parameters in real-time. The instrument is based on the robust and simple idea of a pinhole camera that collects the weakly scattered radiation from a thin sheet of a low-Z material placed in the X-ray beam at an acute angle. We demonstrate how by recording the scattered radiation with an appropriate detector, high-resolution beam characterisation can be performed in real-time. We present a mathematical model that describes the imaging process and beam position measurements. The theoretical evaluation of the resolution limit of our device and its dependence on various parameters are also discussed. Reported experimental results demonstrate the instrument's capabilities in beam tracking and imaging applications. © 2013 IOP Publishing Ltd.