Apertureless near-field optics on commercial AFM: Tip to sample gap control

Abstract

Novel mode of AFM operation is proposed providing the small, few nanometers tip to sample gap, appropriate for the ANSOM experiments. A set-up open for the run-time adjustments, working at ambient conditions is considered. Efficiency of a method is demonstrated by applying it to the laser nano-lithography on different materials with a regular AFM tip. © 2008 IOP Publishing Ltd.