In Situ High-Resolution Microscopy on Duplex Stainless Steels

  • Garfias L
  • Siconolfi D
26Citations
Citations of this article
10Readers
Mendeley users who have this article in their library.
Get full text

Abstract

The aim of the present work is to focus on the characterization of materials ill situ by using a modified near-field scanning optical microscope (NSOM) with a home-built tuning fork head that allowed us to obtain optical imaging concurrently with topography of some systems. The first example is related to finding precursor sites for pitting corrosion on duplex stainless steels (DSS). Precursor sites for pitting on DSS were found to be inclusions that are complex in structure and where metastable pits develop at temperatures below the critical pitting temperature (CPT), but where stable pits, with large corrosion current, occur at the CPT. These inclusions were analyzed and found to be inhomogeneous in nature and consisting of a mixture of various elements (Si, Al, Mg, Ca, Ti, Mn, and S). After analysis of the particles, in situ observation of the particles in 3.5% NaCl and 1 M HCl solutions showed that they developed metastable pits. The pits and corrosion products developed in both particles present in the austenite grains and in particles contained within the ferrite matrix. (C) 2000 The Electrochemical Society. S0013-4651(99)12-033-0. All rights reserved.

Cite

CITATION STYLE

APA

Garfias, L. F., & Siconolfi, D. J. (2000). In Situ High-Resolution Microscopy on Duplex Stainless Steels. Journal of The Electrochemical Society, 147(7), 2525. https://doi.org/10.1149/1.1393564

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free