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Structural Characterization of Supported Planar Bilayers by Using Infrared Spectroscopy and Atomic Force Microscopy

  • Stephens S
  • Dluhy R
Springer Vienna, (1997), 455-457
DOI: 10.1007/978-3-7091-6840-0_108
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Stephens, S. M., & Dluhy, R. A. (1997). Structural Characterization of Supported Planar Bilayers by Using Infrared Spectroscopy and Atomic Force Microscopy. In Progress in Fourier Transform Spectroscopy (pp. 455–457). Springer Vienna. https://doi.org/10.1007/978-3-7091-6840-0_108

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