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Journal ArticleOPEN ACCESS

A Soft X-ray Emission Specrometer with High-energy Resolution for Electron Probe Microanalysis

  • Takahashi H
  • Handa N
  • Murano T
  • et al.
Microscopy and Microanalysis (2010) 16(S2) 34-35
DOI: 10.1017/s1431927610059696
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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Takahashi, H., Handa, N., Murano, T., Terauchi, M., Koike, M., Kawachi, T., … Kuramoto, S. (2010). A Soft X-ray Emission Specrometer with High-energy Resolution for Electron Probe Microanalysis. Microscopy and Microanalysis, 16(S2), 34–35. https://doi.org/10.1017/s1431927610059696

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