Microstructural Analysis Based on Microscopy and X-Ray Diffraction

5Citations
Citations of this article
15Readers
Mendeley users who have this article in their library.
Get full text

Abstract

Characteristic features of ferroelectric materials are the transition in crystal structure from a cubic paraelectric phase to a lower-symmetry ferroelectric phase at the Curie temperature T c and the possibility of changing the polarization of polycrystalline materials by means of electric fields. Both features give rise to challenges with respect to X-ray analysis and microscopy.

Cite

CITATION STYLE

APA

Hoffmann, M. J., Kungl, H., Theissmann, R., & Wagner, S. (2008). Microstructural Analysis Based on Microscopy and X-Ray Diffraction. In Springer Series in Materials Science (Vol. 114, pp. 403–421). Springer Verlag. https://doi.org/10.1007/978-3-540-68683-5_17

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free