Advanced Mueller Ellipsometry Instrumentation and Data Analysis

  • Garcia-Caurel E
  • Ossikovski R
  • Foldyna M
  • et al.
N/ACitations
Citations of this article
22Readers
Mendeley users who have this article in their library.
Get full text

Abstract

I discuss the close connection between the description of plasmons, which are charge excitations localized at the boundaries between dissimilar regions in composite materials, and effective-medium theories (EMTs), which describe the macroscopic dielectric response of such materials. The requirements for the validity of an EMT are also considered. ?? 2010 Elsevier B.V. All rights reserved.

Cite

CITATION STYLE

APA

Garcia-Caurel, E., Ossikovski, R., Foldyna, M., Pierangelo, A., Drévillon, B., & De Martino, A. (2013). Advanced Mueller Ellipsometry Instrumentation and Data Analysis. In Ellipsometry at the Nanoscale (pp. 31–143). Springer Berlin Heidelberg. https://doi.org/10.1007/978-3-642-33956-1_2

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free