The idea behind the atomic force microscope (AFM) is to measure the force between the surface and the scanning tip in order to track the surface topography. Before we describe the atomic force microscopy technique in detail, we consider the forces acting between tip and sample as well as the tip-sample contact mechanics. We consider also the snap-to-contact phenomenon, which can occur due to attractive tip-sample forces.
CITATION STYLE
Voigtländer, B. (2019). Forces between tip and sample. In NanoScience and Technology (pp. 161–176). Springer Verlag. https://doi.org/10.1007/978-3-030-13654-3_10
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