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Analysis of Specimens with Special Geometry: Irregular Bulk Objects and Particles

  • Goldstein J
  • Newbury D
  • Michael J
  • et al.
Springer New York, (2018), 381-411
DOI: 10.1007/978-1-4939-6676-9_23
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Abstract

There are two “zero-th level” assumptions that underpin the basis for quantitative electron-excited X-ray microanalysis:

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APA

Goldstein, J. I., Newbury, D. E., Michael, J. R., Ritchie, N. W. M., Scott, J. H. J., & Joy, D. C. (2018). Analysis of Specimens with Special Geometry: Irregular Bulk Objects and Particles. In Scanning Electron Microscopy and X-Ray Microanalysis (pp. 381–411). Springer New York. https://doi.org/10.1007/978-1-4939-6676-9_23

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