Abstract
In this paper, we present the latest chemical mapping images of heterogeneous mixtures based on far-infrared reflection spectra obtained using a terahertz pulsed imaging system. The terahertz images and spectral data obtained have a spectral resolution of 1 cm-1 and cover a spectral range of 5-80 cm-1. This broad spectral coverage enables us to map out the spatial distribution of individual chemical components of a sample in a single measurement. © 2005 IOP Publishing Ltd.
Cite
CITATION STYLE
Shen, Y. C., Taday, P. F., Newnham, D. A., & Pepper, M. (2005). Chemical mapping using reflection terahertz pulsed imaging. Semiconductor Science and Technology, 20(7). https://doi.org/10.1088/0268-1242/20/7/016
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