Explicit asymptotic formulas for the positions, widths, and strengths of resonances in Mie scattering

  • Lam C
  • Leung P
  • Young K
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Abstract

Explicit asymptotic formulas are derived for the positions, widths, and strengths of the morphology-dependent resonances in Mie scattering. These formulas are compared with numerical data and found to be highly accurate, especially for the low-order resonances most relevant to nonlinear processes. They permit the interpretation of experimental data on light scattering from microdroplets without resorting to the full apparatus of the Mie scattering formalism.

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Authors

  • C. C. Lam

  • P. T. Leung

  • K. Young

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