Explicit asymptotic formulas are derived for the positions, widths, and strengths of the morphology-dependent resonances in Mie scattering. These formulas are compared with numerical data and found to be highly accurate, especially for the low-order resonances most relevant to nonlinear processes. They permit the interpretation of experimental data on light scattering from microdroplets without resorting to the full apparatus of the Mie scattering formalism.
CITATION STYLE
Lam, C. C., Leung, P. T., & Young, K. (1992). Explicit asymptotic formulas for the positions, widths, and strengths of resonances in Mie scattering. Journal of the Optical Society of America B, 9(9), 1585. https://doi.org/10.1364/josab.9.001585
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