Optical characterization of thin films of some phthalocyanines by spectroscopic ellipsometry

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Abstract

Thin films of water-soluble tetrasulphonated phthalocyanines containing copper, nickel and zinc have been made by spin casting on gold. The dielectric function of films with a thickness less than 100 Å have been measured with a rotating-analyser spectroscopic ellipsometer in the photon energy range 1.5-4.5 eV. The 2 eV π electron band has been analysed with respect to resonance energies with line shape analysis. The band could be resolved into three resonances; one of them is shifted towards lower energy as the film thickness decreases. © 1990.

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Mårtensson, J., & Arwin, H. (1990). Optical characterization of thin films of some phthalocyanines by spectroscopic ellipsometry. Thin Solid Films, 188(1), 181–192. https://doi.org/10.1016/0040-6090(90)90204-Q

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