Performance limitations of graphene nanoribbon tunneling FETS due to line edge roughness

  • Luisier M
  • Klimeck G
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A strong deterioration of the performances of GNR TFETs due to LER and the induced source-todrain tunneling leakage is predicted. LER is identified as a crucial design consideration for GNR TFETs that will play an even more important role in ribbons with wqnr

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