Power device packaging technologies for extreme environments

106Citations
Citations of this article
53Readers
Mendeley users who have this article in their library.
Get full text

Abstract

Silicon carbide is a wide-bandgap semiconductor capable of operation at temperatures in excess of 300 °C. However, high-temperature packaging to interface with the other elements of the electrical system is required. Die attach, wire bonding, and passivation materials and techniques have been demonstrated for use at 300 °C. Transient liquid phase bonding has been developed with Au:Sn/Au, yielding high die shear strength after 2000 h at 400 °C. Large diameter (250 μm) gold and platinum wire bonding was evaluated for top side electrical contact. Au wire was reliable after 2000 h at 300 °C with Ti/Ti:W/Au pads over passivation on the SiC. However, Au wire on Ti/Pt/Au and Pt wire on both Ti/TI:W/Au and Ti/Pt/Au exhibited passivation fracture with aging. Polyimide has been demonstrated for 2000 h at 300 °C in air as a high-voltage passivation layer. © 2007 IEEE.

Cite

CITATION STYLE

APA

Johnson, R. W., Wang, C., Liu, Y., & Scofield, J. D. (2007). Power device packaging technologies for extreme environments. IEEE Transactions on Electronics Packaging Manufacturing, 30(3), 182–193. https://doi.org/10.1109/TEPM.2007.899158

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free