Quantitative imaging and diffraction of zeolites using a slow-scan CCD camera

Abstract

We demonstrate ways in which structural information on zeolites can be obtained from high-resolution images and electron diffraction patterns. We employ a commercial slow-scan CCD camera to record the data and demonstrate the advantage of on-line data processing and analysis. Quantitative agreement is obtained between experimental electron diffraction intensities and theoretical calculations. Real-space averaging is a versatile technique which can be employed to reduce the effects of both noise and radiation damage. Under favorable circumstances the weak-phase object approximation can be used to simplify image interpretation and quantification. © 1993.