Single-pulse time- and fluence-resolved optical measurements at femtosecond excited surfaces

Abstract

A modification of time-resolved microscopy was conducted to allow time- and fluence-resolved optical measurements at femtosecond excited surfaces in a single-pulse configuration. The feasibility and the advantages and limits of the technique are demonstrated and discussed with reflectivity measurements on silicon and germanium. The method can be readily extended to other types of optical spectroscopy.