It is important to be able to measure the parameters, such as spatial resolution, astigmastism, signal-to-noise ratio, and drift and instability, that characterize the performance of a scanning electron microscope. These quantities can be determined most reliably by a Fourier analysis of digital micrographs from the instrument, recorded under conditions of interest. A program designed to implement all of the necessary steps in an automated manner has been developed as a 'macro' for the popular, and freely available, NIH Image and SCION Image programs.
CITATION STYLE
Joy, D. C. (2002). SMART - A program to measure SEM resolution and imaging performance. Journal of Microscopy, 208(1), 24–34. https://doi.org/10.1046/j.1365-2818.2002.01062.x
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