Journal article

Structure of pentacene thin films

Ruiz R, Mayer A, Malliaras G, Nickel B, Scoles G, Kazimirov A, Kim H, Headrick R, Islam Z ...see all

Applied Physics Letters, vol. 85, issue 21 (2004) pp. 4926-4928

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Abstract

Grazing incidence x-ray diffraction, x-ray reflectivity and atomic
force microscopy have been performed to study the structure of pentacene
thin films on oxidized Si substrates from submonolayer to multilayer
coverages. The volume of the unit cell in the thin film phase is
almost identical to that of the bulk phase, thus the molecular packing
efficiency is effectively the same in both phases. The structure
forming from the first monolayer remains the same for films at least
190 Å thick. The in-plane structure of the submonolayer islands
also remains unchanged within a substrate temperature range of 0°C while the island size changes by more than a factor of 4.

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Authors

  • Ricardo Ruiz

  • Alex C. Mayer

  • George G. Malliaras

  • Bert Nickel

  • Giacinto Scoles

  • Alexander Kazimirov

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