Journal article

Theory of noncontact dissipation force microscopy

Gauthier M, Tsukada M ...see all

Physical Review B, vol. 60, issue 16 (1999) pp. 11716-11722

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The interaction between the tip of the noncontact atomic force microscope
(nc-AFM) and a surface is analyzed using the Langevin equation approach.
The existence of an intrinsically local energy dissipation mechanism
is demonstrated. This mechanism fundamentally differs from that related
to adhesion hysteresis between the tip and the surface. A scheme
referred to as noncontact dissipation force microscopy is proposed
for producing surface images in ultrahigh vacuum. Moreover, a prospect
for scanning probe microscopy is raised, namely, the possibility
of measuring nanomechanical surface properties. It is also shown
how nc-AFM operated at large amplitude could be used in principle
to measure profiles of both the tip-surface interaction force and
its gradient.

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  • Michel Gauthier

  • Masaru Tsukada

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