Total color difference for rapid and accurate identification of graphene

  • Gao L
  • Ren W
  • Li F
 et al. 
  • 138


    Mendeley users who have this article in their library.
  • 96


    Citations of this article.


For rapid and accurate identification of graphenes by optical images, a total color difference (TCD) method is proposed and demonstrated based on a combination of reflection spectrum and International Commission on Illumination color space. The preferential thickness of different dielectric films covered on a Si substrate is well elucidated, and a 72 nm thick Al(2)O(3) film is found to be much better than the commonly used SiO(2) or Si(3)N(4) films. The TCD both between monolayer graphene and substrate and between graphene of different layers can be further improved by appropriately narrowing the wavelength range of the light source. Moreover, the influences of the objective lens in a real-world optical system on the TCD are also discussed. These findings provide useful information for rapid evaluation of the layer range of graphenes simply by different color bands and for accurate and reliable layer identification due to large TCD values, which opens up the possibility for the nondestructive identification and physical property measurements of graphene with an optical microscope.

Author-supplied keywords

  • Graphene
  • Light source
  • Number of layers
  • Objective lens
  • Optical method
  • Substrate
  • Total color difference

Get free article suggestions today

Mendeley saves you time finding and organizing research

Sign up here
Already have an account ?Sign in

Find this document


  • Libo Gao

  • Wencai Ren

  • Feng Li

  • Hui Ming Cheng

Cite this document

Choose a citation style from the tabs below

Save time finding and organizing research with Mendeley

Sign up for free