We report variation of the work function for single and bilayer graphene devices measured by scanning Kelvin probe microscopy (SKPM). By use of the electric field effect, the work function of graphene can be adjusted as the gate voltage tunes the Fermi level across the charge neutrality point. Upon biasing the device, the surface potential map obtained by SKPM provides a reliable way to measure the contact resistance of individual electrodes contacting graphene. © 2009 American Chemical Society.
CITATION STYLE
Yu, Y. J., Zhao, Y., Ryu, S., Brus, L. E., Kim, K. S., & Kim, P. (2009). Tuning the graphene work function by electric field effect. Nano Letters, 9(10), 3430–3434. https://doi.org/10.1021/nl901572a
Mendeley helps you to discover research relevant for your work.