Spectral characteristics of the hard x ray emission from a plasma focus device

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Abstract

An indirect method to infer the spectra, based on the measurement of the beam intensity transmission through different metallic samples, is described in this communication. A Plasma Focus device (5.67 kJ, 30 kV) was studied as a pulsed hard x ray source, operated with deuterium at a filling pressure in the range of 3 to 5 mbar. Relevant spectral components belonging to the 50 - 150 keV range with a single maximum located in the 75 - 85 keV region were obtained for the radiation coming out of the Plasma Focus chamber, which is made of stainless steel. © 2006 American Institute of Physics.

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Raspa, V., Sigaut, L., Vieytes, R., Clausse, A., & Moreno, C. (2006). Spectral characteristics of the hard x ray emission from a plasma focus device. AIP Conference Proceedings, 875, 438–441. https://doi.org/10.1063/1.2405983

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