A BIST Scheme for a SNR, Gain Tracking, and Frequency Response Test of a Sigma-Delta ADC

Abstract

Built-in-self test (BIST) For VLSI systems is desirable in order to reduce the cost per chip of production-time testing by the manufacturer. In addition, it can provide the means to perform in-the-field diagnostics. This paper discusses a mixed analog-digital BIST (MADBIST) for a signal-to-noise-ratio test, gain tracking test, and frequency response test of a Sigma-Delta analog-to-digital converter. The MADBIST strategy for the SNR, GT, and FR tests of the ADC is introduced, accuracy issues are discussed, and experimental results are presented. © 1995 IEEE