Statistical characterization of complex enclosures with distributed ports

Abstract

A statistical model, the Random Coupling Model, that describes the coupling of radiation into and out of large electrical enclosures is described and generalized. Particular attention is paid to the case in which the ports are electrically large and described by multiple modes (distributed ports). We find a compact expression for a model of the enclosure impedance that can be used to generate probability distributions for fields at the enclosures ports. Results are of interest in the evaluation of power leakage in complex metallic structures and reverberation chambers, and the evaluation of the effectiveness of shielding in the presence of apertures. © 2011 IEEE.