Electrical Characterization of Pentacene Thin Films Using Four-Point-Probe Field-Effect Measurement and Atomic Force Microscope Potentiometry

Nakamura, M., Ohguri, H., Yanagisawa, H., Goto, N., Ohashi, N., & Kudo, K. (n.d.). Electrical Characterization of Pentacene Thin Films Using Four-Point-Probe Field-Effect Measurement and Atomic Force Microscope Potentiometry. In Proc. Int. Symp. Super-Functionality Organic Devices IPAP Conf. Series (Vol. 6, p. 131). Retrieved from http://www.ipap.jp/proc/cs6/pdf/cs6_130.pdf