Extended IMS specification for accumulative test system

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Abstract

There are different methods for automatic generation of test questions (term extraction, templates, accumulation, etc.), but there is no clear specification of that process. In the work is proposed a schema for the process of automatic generation of assessment items. The IMS specification scheme is used as basis and some new elements are complemented for the accumulation, like visualizationDeclaration, ac-cumulationProcessing and accumulativeFeedback to present the accumulation objects. Using the new elements we can overcome some of the problems in e-testing: remembering of the assessment item from the students, automatic creation of different questions, automatic adaptation of the test process, etc.

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Sokolova, M., & Totkov, G. (2008). Extended IMS specification for accumulative test system. In Proceedings of the 9th International Conference on Computer Systems and Technologies and Workshop for PhD Students in Computing, CompSysTech’08. https://doi.org/10.1145/1500879.1500962

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