Abstract
In this paper, we propose an independent component analysis based method for fast event related potential detection for psychological and clinical electroencephalogram applications, and demonstrate the method with psychological facial expression ERP data. We conclude that ICA has great potential for fast ERP detection applications. ©2008 IEEE.
Cite
CITATION STYLE
Tanskanen, J. M. A., Leppänen, J. M., Hietanen, J. K., & Hyttinen, J. A. K. (2008). Independent component analysis in processing event related potentials in electroencephalograms. In BEC 2008 - 2008 International Biennial Baltic Electronics Conference, Proceedings of the 11th Biennial Baltic Electronics Conference (pp. 265–268). https://doi.org/10.1109/BEC.2008.4657531
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