Measurement and modeling of work function changes during low energy cesium sputtering

by J Brison, N Mine, S Poisseroux, B Douhard, R G Vitchev, L Houssiau

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Surface Science (2007)

Volume: 601, Issue: 6, Pages: 1467-1472

ISSN: 00396028
DOI: 10.1016/j.susc.2006.12.078

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Author-supplied keywords

cesium ionization silicon sims sputtering tof work function xenon

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Nicolas Mine

Ph.D. Student

Facultés Universitaires Notre-Dame de la Paix - University of Namur

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