Measurements for Optimization of RF Solid-State Power Amplifiers

Abstract

We propose a tour of nonlinear (NL) measurements of RF actives devices, as NL characterizations are key tasks at each step of the design and test process of power amplifiers. These various NL measurement methods aim to provide device models or to test maximum ratings or specifications (absolute power, efficiency, linearity, distortion...), or to help for the debugging of devices. Investigations on long-term memory effects are described, as these effects are critical when large peak-to-average modulations are applied into SSPAs.