Abstract
We describe the approach used to calculate and verify on-orbit upset rates of radiation hardened microprocessors. System designers use these error rates to choose between microprocessors and add appropriate system-level recovery and redundancy. © 2011 IEEE.
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Cabanas-Holmen, M., Cannon, E. H., Amort, T., Ballast, J., Brees, R., Fischer, S., … Wert, J. (2011). Predicting the single-event error rate of a radiation hardened by design microprocessor. In IEEE Transactions on Nuclear Science (Vol. 58, pp. 2726–2733). https://doi.org/10.1109/TNS.2011.2168978
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