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Scanning Single-Electron Transistor Microscopy

  • Zhitenev N
  • Fulton T
CRC Press, (2014), 4200-4206
DOI: 10.1081/e-enn3-120009269
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Zhitenev, N. B., & Fulton, T. A. (2014). Scanning Single-Electron Transistor Microscopy. In Dekker Encyclopedia of Nanoscience and Nanotechnology, Third Edition (pp. 4200–4206). CRC Press. https://doi.org/10.1081/e-enn3-120009269

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